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Brittle Material Substrate: Sapphire
Case 1: Lapping/Polishing Sapphire Wafers
Recently, the diameters of sapphire, silicon carbide (SiC), and gallium nitride (GaN) wafers used as LED substrates have rapidly become larger. We developed the equipment and process for larger-diameter sapphire wafers that especially require cost reduction, and succeeded in stabilizing the quality of the wafers and reducing the process cost.
Lapping/Polishing Process and Method
Process Result
3 inch wafer
TTV BOW WARP: <20 µm
Thickness: +/-10 µm
Surface roughness: Ra:0.5 µm or less
Value measured by AFM: 0.2 µm or less

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